Model-Agnostic Scoring Methods for Artificial Intelligence Assurance
Published in 2022 IEEE 29th Annual Software Technology Conference (STC), 9–18, 2022
Authors: Sikder, M. N. K., Batarseh, F. A., Wang, P., & Gorentala, N.
Venue: 2022 IEEE 29th Annual Software Technology Conference (STC), 9–18
Recommended citation: Sikder, M. N. K., Batarseh, F. A., Wang, P., & Gorentala, N. (2022). "Model-Agnostic Scoring Methods for Artificial Intelligence Assurance." 2022 IEEE 29th Annual Software Technology Conference (STC), 9–18.
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